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Top level mock wrapper #19

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ryankurte opened this issue Feb 5, 2019 · 0 comments
Open

Top level mock wrapper #19

ryankurte opened this issue Feb 5, 2019 · 0 comments

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@ryankurte
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For driver testing it is sometimes useful to expect a series of operations across a variety of peripherals (for example, pins, SPI, delays).

I haven't yet worked out exactly how, some refactoring will be required, but I think we should be able to create a top level / generic mock over a set of peripherals, while using the individual peripheral code to evaluate each "transaction".
ryankurte added a commit to ryankurte/embedded-hal-mock that referenced this issue Apr 23, 2019
@ryankurte
First pass at a higher level mocking engine
702025c 
This allows multiple devices to be used in a single mock run, towards dbrgn#19
@ryankurte ryankurte mentioned this issue Apr 24, 2019
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@tommy-gilligan tommy-gilligan mentioned this issue Feb 1, 2024
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